Nano Indentation Test - Surface Young’s Modulus-

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Summary

Nano Indentation test by SPM(Scanning Probe Microscopy) with a diamond probe can measure Surface Young’s Modulus through the analysis of the relationship between a normal load and a depth displacement by the diamond probe. The minimum detection normal load is 0.1 μm.

The Relationship between values measured by SPM and literature values

Surface Young’s Modulus of the Metal thin layer deposited on a polymer film

Measured values of various samples by SPM are almost equal to literature values of each of a standard sample.
1) International Tables of Selected Constants, 16, metals International Critical Tables, Vol.III

Search Number 6O001

Download The Technical Note of This Exapmle.

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