Evaluation of Element Distribution of Polymer Bonded Interface
- Low Acceleration Voltage SEM-EDS -



Polymer materials are composed of light elements such as C, N, O and F and low in density. For this reason, an evaluation of the distribution of elements on the order of microns by the conventional SEM-EDS method (under which measurement is made at an acceleration voltage of 5kV or higher) has been impossible. It is now possible to evaluate the contact interface of polymers in nano order by carrying out measurements at low acceleration voltage (acceleration voltage: 5kV or lower) by use of a latest high-sensitivity EDS detector.

Evaluation of the element distribution of the contact interface

The difference in the mutual diffusion width was confirmed by using a 4-hour-treated sample and a 1-hour-treated sample.

Search Number 4053

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