Cross-Sectional Observation of
Smartphone Display Touch Panel Electrodes



It is possible to prepare a specimen of a targeted microfine region of a smartphone display by FIB processing and carry out the TEM observation and analysis of the specimen. Here is an example of an observation and element analysis of a micro structure of an elemental device that were performed by the method described above.

Analysis sample: Smartphone on the TFT substrate side

Results of EDS element analysis of Enlarged view B (imaging)

This analytical method is effective for making a structural comparison of models and determining the causes of troubles.

Search Number 4037

Download The Technical Note of This Exapmle.

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