Cross-Sectional Observation of Silicon-Based Solar Battery
- Transmission Electron Microscope (TEM) -

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Summary

A specimen was prepared from the area in the vicinity of the Si layer electrode of a solar battery panel by use of focused ion beam (FIB) equipment, and the shape observation and element mapping of the specimen were carried out by use of the field emission transmission electron microscope (FE-TEM). From the observation, information on the surface profile of the silicone can be obtained. Furthermore, the element mapping makes it possible to observe the conditions of the indium oxide film formed on the silicon surface and the way the silver (Ag) granulated in the electrode section is covered with resin (C). Thus, the use of the transmission electron microscope enables you to obtain information on the composition of the layer structure and the electrode.

Cross-sectional observation with the transmission electron microscope (TEM)

Search Number 4026

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