Analysis of anionic and cationic contaminations on the surface of circuit boards and circuit board assemblies

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Summary

Ionic contaminations cause defects in insulating materials, as a result, performance and reliability of electrical products decrease.

ANAC can analyze ionic contaminations on a silicon wafer and glass substrate surface with high sensitivity by Extraction-column concentrated ion Chromatography.

Ions measurable

Anions: F-、Cl-、NO2-、NO3-、PO43-、SO42-、Organic Acids
Cations: NH4+、Amines(MMA、DMA、TMA)

Method

Extraction by Hyperpure water ⇒ Extraction-column concentrated ion chromatography

Analyte

A Silicon wafer (~12 inches diameter)

A Glass substrate(~ 50cm×75cm)

The Lower Limit of detection
(In the case that extraction fluid volume is 20mL)

※The limit of detection depends on the element, the matrix and the measurement conditions.

Search Number 3004

Download The Technical Note of This Exapmle.

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