Analysis of Microsamples and Trace Components by X-ray Diffraction Analysis

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Summary

The crystalline material contained in a sample and its crystalline structure can be identified by analyzing the diffraction patter that is obtained by irradiating X-rays onto the sample.

Example of analysis: Determination of trace foreign matter

Our equipment which is capable of making measurement with high brightness X-rays that concentrate light at 0.4mm can analyze microsamples and location (>100 μm) which is impossible with general equipment. It was found that the rutile type* of titanium oxide TiO2 was present as foreign matter in the film.

Example of analysis: Determination of trace components

Our equipment which is capable of making high-S/N measurements with high brightness X-rays and a high-sensitivity detector can perform the analysis of a dilute component (>0.1wt%) that is impossible with general equipment. The rutile type* of titanium oxide TiO2 was detected in the amount of 0.1wt% in the sheet.

*TiO2 is available in various types of crystal polymorphism, namely rutile, anatase and brookite types.

Search Number 1036

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